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Analytical Instrumentation
JEOL Scanning Electron Microscope (SEM) with LaB6 Source, SEI, BEI, EDX and Automated WDX Analysis
JEOL Field Emission SEM with EDX and Cold Stage
Veeco Dimension 3100 AFM/SPM
TA Thermogravimetric Analysis (TGA)
Thermoscientific FTIR
Thermoscientific Micro FTIR
Denton Metal Sputtering/Carbon Evaporation Systems
Optical Microscopes
Residual Gas Analysis (RGA)
Zeiss Stereomicroscopes
Compound Optical Microscopes
Leica Microtomes
Accelerated Life Test Units
Carver Heated Hydraulic Press
Struers High Precision Polishers
